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Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond.

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Bibliographic Details
Title: Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond.
Authors: Lee, Yang‐Chun1 (AUTHOR), Chang, Sih‐Wei1 (AUTHOR), Chen, Shu‐Hsien1 (AUTHOR), Chen, Shau‐Liang1 (AUTHOR), Chen, Hsuen‐Li1 (AUTHOR) hsuenlichen@ntu.edu.tw
Source: Advanced Science. 1/5/2022, Vol. 9 Issue 1, p1-36. 36p.
Database: Academic Search Ultimate
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Description
ISSN:21983844
DOI:10.1002/advs.202102128