APA (7th ed.) Citation

Lee, Y., Chang, S., Chen, S., Chen, S., & Chen, H. (2022). Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond. Advanced Science, 9(1), 1. https://doi.org/10.1002/advs.202102128

Chicago Style (17th ed.) Citation

Lee, Yang‐Chun, Sih‐Wei Chang, Shu‐Hsien Chen, Shau‐Liang Chen, and Hsuen‐Li Chen. "Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond." Advanced Science 9, no. 1 (2022): 1. https://doi.org/10.1002/advs.202102128.

MLA (9th ed.) Citation

Lee, Yang‐Chun, et al. "Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond." Advanced Science, vol. 9, no. 1, 2022, p. 1, https://doi.org/10.1002/advs.202102128.