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Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond.

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Title: Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond.
Authors: Lee, Yang‐Chun1 (AUTHOR), Chang, Sih‐Wei1 (AUTHOR), Chen, Shu‐Hsien1 (AUTHOR), Chen, Shau‐Liang1 (AUTHOR), Chen, Hsuen‐Li1 (AUTHOR) hsuenlichen@ntu.edu.tw
Source: Advanced Science. 1/5/2022, Vol. 9 Issue 1, p1-36. 36p.
Database: Academic Search Ultimate
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  Data: Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond.
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  Data: <searchLink fieldCode="AR" term="%22Lee%2C+Yang‐Chun%22">Lee, Yang‐Chun</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chang%2C+Sih‐Wei%22">Chang, Sih‐Wei</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Shu‐Hsien%22">Chen, Shu‐Hsien</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Shau‐Liang%22">Chen, Shau‐Liang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Hsuen‐Li%22">Chen, Hsuen‐Li</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> hsuenlichen@ntu.edu.tw</i>
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  Data: <searchLink fieldCode="JN" term="%22Advanced+Science%22">Advanced Science</searchLink>. 1/5/2022, Vol. 9 Issue 1, p1-36. 36p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=154497968
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        Value: 10.1002/advs.202102128
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        Text: English
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      – TitleFull: Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond.
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              Text: 1/5/2022
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