Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond.
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| Title: | Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond. |
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| Authors: | Lee, Yang‐Chun1 (AUTHOR), Chang, Sih‐Wei1 (AUTHOR), Chen, Shu‐Hsien1 (AUTHOR), Chen, Shau‐Liang1 (AUTHOR), Chen, Hsuen‐Li1 (AUTHOR) hsuenlichen@ntu.edu.tw |
| Source: | Advanced Science. 1/5/2022, Vol. 9 Issue 1, p1-36. 36p. |
| Database: | Academic Search Ultimate |
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