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Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques.

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Title: Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques.
Authors: Gallagher, James C.1 (AUTHOR) james.gallagher@nrl.navy.mil, Ebrish, Mona A.2 (AUTHOR), Porter, Matthew A.3 (AUTHOR), Jacobs, Alan G.2 (AUTHOR), Gunning, Brendan P.4 (AUTHOR), Kaplar, Robert J.4 (AUTHOR), Hobart, Karl D.1 (AUTHOR), Anderson, Travis J.1 (AUTHOR)
Source: Scientific Reports. 1/13/2022, Vol. 12 Issue 1, p1-8. 8p.
Database: Academic Search Ultimate
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ISSN:20452322
DOI:10.1038/s41598-021-04170-2