APA (7th ed.) Citation

Gallagher, J. C., Ebrish, M. A., Porter, M. A., Jacobs, A. G., Gunning, B. P., Kaplar, R. J., . . . Anderson, T. J. (2022). Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques. Scientific Reports, 12(1), 1. https://doi.org/10.1038/s41598-021-04170-2

Chicago Style (17th ed.) Citation

Gallagher, James C., Mona A. Ebrish, Matthew A. Porter, Alan G. Jacobs, Brendan P. Gunning, Robert J. Kaplar, Karl D. Hobart, and Travis J. Anderson. "Optimizing Performance and Yield of Vertical GaN Diodes Using Wafer Scale Optical Techniques." Scientific Reports 12, no. 1 (2022): 1. https://doi.org/10.1038/s41598-021-04170-2.

MLA (9th ed.) Citation

Gallagher, James C., et al. "Optimizing Performance and Yield of Vertical GaN Diodes Using Wafer Scale Optical Techniques." Scientific Reports, vol. 12, no. 1, 2022, p. 1, https://doi.org/10.1038/s41598-021-04170-2.