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Dual Attention-Based Industrial Surface Defect Detection with Consistency Loss.

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Bibliographic Details
Title: Dual Attention-Based Industrial Surface Defect Detection with Consistency Loss.
Authors: Li, Xuyang1 (AUTHOR) 200611021@sust.edu.cn, Zheng, Yu2 (AUTHOR) yuzheng.xidian@gmail.com, Chen, Bei1 (AUTHOR) chenbei@sust.edu.cn, Zheng, Enrang1 (AUTHOR) zhenger@sust.edu.cn
Source: Sensors (14248220). Jul2022, Vol. 22 Issue 14, pN.PAG-N.PAG. 18p.
Database: Academic Search Ultimate
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ISSN:14248220
DOI:10.3390/s22145141