Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device.

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Bibliographic Details
Title: Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device.
Authors: Cheng, Yuan1,2 (AUTHOR), Luo, Yaozhi1 (AUTHOR), Shen, Ruihong1,2 (AUTHOR) srh_1023@163.com, Kong, Deyu3 (AUTHOR) srh_1023@163.com, Zhou, Weiyong4 (AUTHOR)
Source: Materials (1996-1944). Jan2023, Vol. 16 Issue 2, p681. 9p.
Database: Academic Search Ultimate
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