Roughness Study of Solar Wafer by Angular Speckle and Binary Imaging Techniques.
Saved in:
| Title: | Roughness Study of Solar Wafer by Angular Speckle and Binary Imaging Techniques. |
|---|---|
| Authors: | Rathina, K.1, Balamurugan, R.1 balamurugan.r.sci@kct.ac.in |
| Source: | Lasers in Engineering (Old City Publishing). 2022, Vol. 53 Issue 5/6, p379-391. 13p. |
| Database: | Academic Search Ultimate |
| ISSN: | 08981507 |
|---|
