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Roughness Study of Solar Wafer by Angular Speckle and Binary Imaging Techniques.

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Title: Roughness Study of Solar Wafer by Angular Speckle and Binary Imaging Techniques.
Authors: Rathina, K.1, Balamurugan, R.1 balamurugan.r.sci@kct.ac.in
Source: Lasers in Engineering (Old City Publishing). 2022, Vol. 53 Issue 5/6, p379-391. 13p.
Database: Academic Search Ultimate
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  Data: <searchLink fieldCode="JN" term="%22Lasers+in+Engineering+%28Old+City+Publishing%29%22">Lasers in Engineering (Old City Publishing)</searchLink>. 2022, Vol. 53 Issue 5/6, p379-391. 13p.
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