APA (7th ed.) Citation

Liao, R., Chen, H., Lin, P., Liang, T., Su, K., Lin, I., . . . Cheng, C. (2023). Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices. Materials (1996-1944), 16(9), 3306. https://doi.org/10.3390/ma16093306

Chicago Style (17th ed.) Citation

Liao, Ruo-Yin, et al. "Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices." Materials (1996-1944) 16, no. 9 (2023): 3306. https://doi.org/10.3390/ma16093306.

MLA (9th ed.) Citation

Liao, Ruo-Yin, et al. "Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices." Materials (1996-1944), vol. 16, no. 9, 2023, p. 3306, https://doi.org/10.3390/ma16093306.