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Temperature sensitive analytical analysis of gate‐stack dual metal nanowire field‐effect transistor (4H‐SiC).

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Title: Temperature sensitive analytical analysis of gate‐stack dual metal nanowire field‐effect transistor (4H‐SiC).
Authors: Neeraj1 (AUTHOR) s.neerumalik@gmail.com, Sharma, Shobha1 (AUTHOR), Goel, Anubha2 (AUTHOR) anubhagoel15@gmail.com, Rewari, Sonam3 (AUTHOR), Gupta, Radhey Shyam2 (AUTHOR)
Source: International Journal of Numerical Modelling. Jul2023, Vol. 36 Issue 4, p1-15. 15p.
Database: Academic Search Ultimate
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An: 164136346
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  Data: Temperature sensitive analytical analysis of gate‐stack dual metal nanowire field‐effect transistor (4H‐SiC).
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  Data: <searchLink fieldCode="AR" term="%22Neeraj%22">Neeraj</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> s.neerumalik@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Sharma%2C+Shobha%22">Sharma, Shobha</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Goel%2C+Anubha%22">Goel, Anubha</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> anubhagoel15@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Rewari%2C+Sonam%22">Rewari, Sonam</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Gupta%2C+Radhey+Shyam%22">Gupta, Radhey Shyam</searchLink><relatesTo>2</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Numerical+Modelling%22">International Journal of Numerical Modelling</searchLink>. Jul2023, Vol. 36 Issue 4, p1-15. 15p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=164136346
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      – Type: doi
        Value: 10.1002/jnm.3065
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      – Code: eng
        Text: English
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        PageCount: 15
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      – TitleFull: Temperature sensitive analytical analysis of gate‐stack dual metal nanowire field‐effect transistor (4H‐SiC).
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            NameFull: Neeraj
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            NameFull: Sharma, Shobha
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            NameFull: Goel, Anubha
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            NameFull: Rewari, Sonam
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            NameFull: Gupta, Radhey Shyam
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            – D: 01
              M: 07
              Text: Jul2023
              Type: published
              Y: 2023
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              Value: 36
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