Identification of Lossy Y-Type Two-Port Circuit Models under Measurement Uncertainties: Closed-Form Solution and Statistical–Perturbative Characterization.
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| Title: | Identification of Lossy Y-Type Two-Port Circuit Models under Measurement Uncertainties: Closed-Form Solution and Statistical–Perturbative Characterization. |
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| Authors: | Fiori, Simone1 (AUTHOR) s.fiori@staff.univpm.it, Cisse, Cheikh2 (AUTHOR) |
| Source: | Energies (19961073). Aug2023, Vol. 16 Issue 16, p6037. 19p. |
| Database: | Academic Search Ultimate |
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| ISSN: | 19961073 |
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| DOI: | 10.3390/en16166037 |
