Accurate X‐ray diffraction data required for proper evaluation of bond valence sums and global instability indexes: redetermination of the crystal structures of diamond‐like Cu2CdSiS4 and Cu2HgSnS4 as a case study

Saved in:
Bibliographic Details
Title: Accurate X‐ray diffraction data required for proper evaluation of bond valence sums and global instability indexes: redetermination of the crystal structures of diamond‐like Cu2CdSiS4 and Cu2HgSnS4 as a case study
Authors: Treece, Megan M.1 (AUTHOR), Kelly, Jordan C.1 (AUTHOR), Rosello, Kate E.1 (AUTHOR), Craig, Andrew J.1 (AUTHOR), Aitken, Jennifer A.1 (AUTHOR) aitkenj@duq.edu
Source: Acta Crystallographica Section C: Structural Chemistry. Sep2023, Vol. 79 Issue 9, p353-364. 12p.
Database: Academic Search Ultimate
Full text is not displayed to guests.
Description
ISSN:20532296
DOI:10.1107/S2053229623006848