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Machine condition monitoring in FDM based on electret microphone, SVM, and neural networks.

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Bibliographic Details
Title: Machine condition monitoring in FDM based on electret microphone, SVM, and neural networks.
Authors: Lopes, Thiago Glissoi1 (AUTHOR) thiago.glissoi@unesp.br, Aguiar, Paulo Roberto1 (AUTHOR), Monson, Paulo Monteiro de Carvalho1 (AUTHOR), D'Addona, Doriana Marilena2 (AUTHOR), Conceição Júnior, Pedro de Oliveira3 (AUTHOR), de Oliveira Junior, Reinaldo Götz1,4 (AUTHOR)
Source: International Journal of Advanced Manufacturing Technology. Nov2023, Vol. 129 Issue 3/4, p1769-1786. 18p.
Database: Academic Search Ultimate
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Description
ISSN:02683768
DOI:10.1007/s00170-023-12375-0