A Novel Technique of Extracting UCN Decay Lifetime from Storage Chamber Measurements Dominated by Scattering Losses.

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Title: A Novel Technique of Extracting UCN Decay Lifetime from Storage Chamber Measurements Dominated by Scattering Losses.
Authors: Mohanmurthy, Prajwal1,2 (AUTHOR) prajwal@alum.mit.edu, Formaggio, Joseph2 (AUTHOR), Salvat, Daniel J.3 (AUTHOR), Winger, Jeff A.4 (AUTHOR) prajwal@alum.mit.edu
Source: Symmetry (20738994). Oct2023, Vol. 15 Issue 10, p1899. 19p.
Database: Academic Search Ultimate
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ISSN:20738994
DOI:10.3390/sym15101899