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Effect of sample carriers on analytical parameters in total reflection X-ray fluorescence - a tool for multi-trace elemental analysis.

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Bibliographic Details
Title: Effect of sample carriers on analytical parameters in total reflection X-ray fluorescence - a tool for multi-trace elemental analysis.
Authors: Manjunatha1 (AUTHOR), Bennal, A. S.1 (AUTHOR) arvindbennal@gmail.com, Badiger, N. M.2 (AUTHOR), Stosnach, H.3 (AUTHOR), Kariduraganavar, M. Y.4 (AUTHOR)
Source: Spectroscopy Letters. 2024, Vol. 57 Issue 1, p45-58. 14p.
Database: Academic Search Ultimate
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Description
ISSN:00387010
DOI:10.1080/00387010.2023.2285912