View in EDS HTML Full Text PDF Full Text

Deep-silicon photon-counting x-ray projection denoising through reinforcement learning.

Saved in:
Bibliographic Details
Title: Deep-silicon photon-counting x-ray projection denoising through reinforcement learning.
Authors: Tanveer, Md Sayed1 (AUTHOR), Wiedeman, Christopher2 (AUTHOR), Li, Mengzhou1 (AUTHOR), Shi, Yongyi1 (AUTHOR), De Man, Bruno3 (AUTHOR), Maltz, Jonathan S.4 (AUTHOR), Wang, Ge1 (AUTHOR) wangg6@rpi.edu
Source: Journal of X-Ray Science & Technology. 2024, Vol. 32 Issue 2, p173-205. 33p.
Database: Academic Search Ultimate
Full text is not displayed to guests.
Description
ISSN:08953996
DOI:10.3233/XST-230278