APA (7th ed.) Citation

Tanveer, M. S., Wiedeman, C., Li, M., Shi, Y., De Man, B., Maltz, J. S., & Wang, G. (2024). Deep-silicon photon-counting x-ray projection denoising through reinforcement learning. Journal of X-Ray Science & Technology, 32(2), 173. https://doi.org/10.3233/XST-230278

Chicago Style (17th ed.) Citation

Tanveer, Md Sayed, Christopher Wiedeman, Mengzhou Li, Yongyi Shi, Bruno De Man, Jonathan S. Maltz, and Ge Wang. "Deep-silicon Photon-counting X-ray Projection Denoising Through Reinforcement Learning." Journal of X-Ray Science & Technology 32, no. 2 (2024): 173. https://doi.org/10.3233/XST-230278.

MLA (9th ed.) Citation

Tanveer, Md Sayed, et al. "Deep-silicon Photon-counting X-ray Projection Denoising Through Reinforcement Learning." Journal of X-Ray Science & Technology, vol. 32, no. 2, 2024, p. 173, https://doi.org/10.3233/XST-230278.