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Deep-silicon photon-counting x-ray projection denoising through reinforcement learning.

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Title: Deep-silicon photon-counting x-ray projection denoising through reinforcement learning.
Authors: Tanveer, Md Sayed1 (AUTHOR), Wiedeman, Christopher2 (AUTHOR), Li, Mengzhou1 (AUTHOR), Shi, Yongyi1 (AUTHOR), De Man, Bruno3 (AUTHOR), Maltz, Jonathan S.4 (AUTHOR), Wang, Ge1 (AUTHOR) wangg6@rpi.edu
Source: Journal of X-Ray Science & Technology. 2024, Vol. 32 Issue 2, p173-205. 33p.
Database: Academic Search Ultimate
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  Data: Deep-silicon photon-counting x-ray projection denoising through reinforcement learning.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+X-Ray+Science+%26+Technology%22">Journal of X-Ray Science & Technology</searchLink>. 2024, Vol. 32 Issue 2, p173-205. 33p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=176365885
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.3233/XST-230278
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      – Code: eng
        Text: English
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        PageCount: 33
        StartPage: 173
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      – TitleFull: Deep-silicon photon-counting x-ray projection denoising through reinforcement learning.
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            NameFull: Tanveer, Md Sayed
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            NameFull: Wiedeman, Christopher
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            NameFull: Li, Mengzhou
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            NameFull: Shi, Yongyi
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            NameFull: De Man, Bruno
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            NameFull: Maltz, Jonathan S.
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            NameFull: Wang, Ge
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            – D: 01
              M: 03
              Text: 2024
              Type: published
              Y: 2024
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            – TitleFull: Journal of X-Ray Science & Technology
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