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Properties of X-ray diffraction and Raman scattering in PbSe, PbS and PbSe0.5S0.5 thin films.

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Bibliographic Details
Title: Properties of X-ray diffraction and Raman scattering in PbSe, PbS and PbSe0.5S0.5 thin films.
Authors: Yasinova, S. N.1 sara.novruzova@yahoo.com, Mekhtiyeva, S. I.2, Huseynaliyev, M. H.1, Alekberov, R. I.2
Source: Chalcogenide Letters. May2024, Vol. 21 Issue 5, p377-383. 7p.
Database: Academic Search Ultimate
Description
ISSN:18414834
DOI:10.15251/CL.2024.215.377