Yasinova, S. N., Mekhtiyeva, S. I., Huseynaliyev, M. H., & Alekberov, R. I. (2024). Properties of X-ray diffraction and Raman scattering in PbSe, PbS and PbSe0.5S0.5 thin films. Chalcogenide Letters, 21(5), 377. https://doi.org/10.15251/CL.2024.215.377
Chicago Style (17th ed.) CitationYasinova, S. N., S. I. Mekhtiyeva, M. H. Huseynaliyev, and R. I. Alekberov. "Properties of X-ray Diffraction and Raman Scattering in PbSe, PbS and PbSe0.5S0.5 Thin Films." Chalcogenide Letters 21, no. 5 (2024): 377. https://doi.org/10.15251/CL.2024.215.377.
MLA (9th ed.) CitationYasinova, S. N., et al. "Properties of X-ray Diffraction and Raman Scattering in PbSe, PbS and PbSe0.5S0.5 Thin Films." Chalcogenide Letters, vol. 21, no. 5, 2024, p. 377, https://doi.org/10.15251/CL.2024.215.377.