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Experimental Study on Damage Effect of Mid-Infrared Pulsed Laser on Charge Coupled Device (CCD) and HgCgTe Detectors.

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Title: Experimental Study on Damage Effect of Mid-Infrared Pulsed Laser on Charge Coupled Device (CCD) and HgCgTe Detectors.
Authors: Liu, Yang1 (AUTHOR) liuyangdk@ciomp.ac.cn, Zhou, Feng2 (AUTHOR) zhougj776@sohu.com, Wang, Yunzhe1,3 (AUTHOR) wangyunzhe20@mails.ucas.ac.cn, Zhang, Yin1,3 (AUTHOR) zhenghanyu22@mails.ucas.ac.cn, Zhang, Yunfeng1 (AUTHOR) 13159754836@163.com, Zheng, Hanyu1,3 (AUTHOR), Shao, Junfeng1 (AUTHOR)
Source: Sensors (14248220). Jul2024, Vol. 24 Issue 13, p4380. 15p.
Database: Academic Search Ultimate
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ISSN:14248220
DOI:10.3390/s24134380