APA (7th ed.) Citation

Liu, Y., Zhou, F., Wang, Y., Zhang, Y., Zhang, Y., Zheng, H., & Shao, J. (2024). Experimental Study on Damage Effect of Mid-Infrared Pulsed Laser on Charge Coupled Device (CCD) and HgCgTe Detectors. Sensors (14248220), 24(13), 4380. https://doi.org/10.3390/s24134380

Chicago Style (17th ed.) Citation

Liu, Yang, Feng Zhou, Yunzhe Wang, Yin Zhang, Yunfeng Zhang, Hanyu Zheng, and Junfeng Shao. "Experimental Study on Damage Effect of Mid-Infrared Pulsed Laser on Charge Coupled Device (CCD) and HgCgTe Detectors." Sensors (14248220) 24, no. 13 (2024): 4380. https://doi.org/10.3390/s24134380.

MLA (9th ed.) Citation

Liu, Yang, et al. "Experimental Study on Damage Effect of Mid-Infrared Pulsed Laser on Charge Coupled Device (CCD) and HgCgTe Detectors." Sensors (14248220), vol. 24, no. 13, 2024, p. 4380, https://doi.org/10.3390/s24134380.