Application of deep metric learning model to microscope image analysis for the determination of UOC samples in nuclear forensics analysis.
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| Title: | Application of deep metric learning model to microscope image analysis for the determination of UOC samples in nuclear forensics analysis. |
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| Authors: | Kimura, Yoshiki1 (AUTHOR) kimura.yoshiki@jaea.go.jp, Matsumoto, Tetsuya2 (AUTHOR), Yamaguchi, Tomoki1 (AUTHOR) |
| Source: | Journal of Radioanalytical & Nuclear Chemistry. Jul2024, Vol. 333 Issue 7, p3541-3551. 11p. |
| Database: | Academic Search Ultimate |
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| ISSN: | 02365731 |
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| DOI: | 10.1007/s10967-023-09300-w |
