Kimura, Y., Matsumoto, T., & Yamaguchi, T. (2024). Application of deep metric learning model to microscope image analysis for the determination of UOC samples in nuclear forensics analysis. Journal of Radioanalytical & Nuclear Chemistry, 333(7), 3541. https://doi.org/10.1007/s10967-023-09300-w
Chicago Style (17th ed.) CitationKimura, Yoshiki, Tetsuya Matsumoto, and Tomoki Yamaguchi. "Application of Deep Metric Learning Model to Microscope Image Analysis for the Determination of UOC Samples in Nuclear Forensics Analysis." Journal of Radioanalytical & Nuclear Chemistry 333, no. 7 (2024): 3541. https://doi.org/10.1007/s10967-023-09300-w.
MLA (9th ed.) CitationKimura, Yoshiki, et al. "Application of Deep Metric Learning Model to Microscope Image Analysis for the Determination of UOC Samples in Nuclear Forensics Analysis." Journal of Radioanalytical & Nuclear Chemistry, vol. 333, no. 7, 2024, p. 3541, https://doi.org/10.1007/s10967-023-09300-w.