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High-Resolution Characterization of Enamel Remineralization Using Time-of-Flight Secondary Ion Mass Spectrometry and Electron Microscopy.

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Bibliographic Details
Title:	High-Resolution Characterization of Enamel Remineralization Using Time-of-Flight Secondary Ion Mass Spectrometry and Electron Microscopy.
Authors:	Kiesow, Andreas¹ (AUTHOR), Morawietz, Maria¹ (AUTHOR), Gruner, Jennifer² (AUTHOR), Gierth, Stephan¹ (AUTHOR), Berthold, Lutz¹ (AUTHOR), Schneiderman, Eva² (AUTHOR), St. John, Samuel² (AUTHOR)
Source:	Caries Research. 2024, Vol. 58 Issue 4, p407-420. 14p.
Database:	Academic Search Ultimate
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Description
ISSN:	00086568
DOI:	10.1159/000535979