View in EDS

Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena.

Saved in:
Bibliographic Details
Title: Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena.
Authors: Hasse, Lech1, Spiralski, Ludwik1,2, Turczynski, Janusz3
Source: AIP Conference Proceedings. 2005, Vol. 780 Issue 1, p725-728. 4p.
Database: Academic Search Ultimate
Be the first to leave a comment!
You must be logged in first