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Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena.

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Bibliographic Details
Title:	Foil Capacitors Reliability Prediction Based On Fluctuation And Non-Linear Phenomena.
Authors:	Hasse, Lech¹, Spiralski, Ludwik^1,2, Turczynski, Janusz³
Source:	AIP Conference Proceedings. 2005, Vol. 780 Issue 1, p725-728. 4p.
Database:	Academic Search Ultimate

Description
ISSN:	0094243X
DOI:	10.1063/1.2036853