View in EDS HTML Full Text PDF Full Text

Development and characterization of a novel wheat-rye T2DS·2DL-2RL translocation line with high stripe rust resistance.

Saved in:
Bibliographic Details
Title: Development and characterization of a novel wheat-rye T2DS·2DL-2RL translocation line with high stripe rust resistance.
Authors: Ji, Yuzhou1,2 (AUTHOR), Han, Guohao3 (AUTHOR), Gong, Wenping1 (AUTHOR), Han, Ran1 (AUTHOR), Wang, Xiaolu1 (AUTHOR), Bao, Yinguang2 (AUTHOR), Li, Jianbo4 (AUTHOR), Liu, Aifeng1 (AUTHOR), Li, Haosheng1 (AUTHOR), Liu, Jianjun1 (AUTHOR), Ma, Pengtao5 (AUTHOR) ptma@ytu.edu.cn, Liu, Cheng1 (AUTHOR) lch6688407@163.com
Source: Phytopathology Research. 11/7/2024, Vol. 6 Issue 1, p1-10. 10p.
Database: Academic Search Ultimate
Full text is not displayed to guests.
Description
ISSN:20965362
DOI:10.1186/s42483-024-00281-6