APA (7th ed.) Citation

Ji, Y., Han, G., Gong, W., Han, R., Wang, X., Bao, Y., . . . Liu, C. (2024). Development and characterization of a novel wheat-rye T2DS·2DL-2RL translocation line with high stripe rust resistance. Phytopathology Research, 6(1), 1. https://doi.org/10.1186/s42483-024-00281-6

Chicago Style (17th ed.) Citation

Ji, Yuzhou, et al. "Development and Characterization of a Novel Wheat-rye T2DS·2DL-2RL Translocation Line with High Stripe Rust Resistance." Phytopathology Research 6, no. 1 (2024): 1. https://doi.org/10.1186/s42483-024-00281-6.

MLA (9th ed.) Citation

Ji, Yuzhou, et al. "Development and Characterization of a Novel Wheat-rye T2DS·2DL-2RL Translocation Line with High Stripe Rust Resistance." Phytopathology Research, vol. 6, no. 1, 2024, p. 1, https://doi.org/10.1186/s42483-024-00281-6.