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Nanoscale Calibration Standards for On-Wafer S-Parameters measurements up to 110 GHz.

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Bibliographic Details
Title: Nanoscale Calibration Standards for On-Wafer S-Parameters measurements up to 110 GHz.
Authors: Seck, Daouda1,2 Daouda.Seck@lne.fr, Allal, Djamel1, Marlec, Florent2, Lenoir, Clément2, Sebbache, Mohamed2, Haddadi, Kamel2 Daouda.Seck@lne.fr
Source: EPJ Web of Conferences. 4/7/2025, Vol. 323, p1-4. 4p.
Database: Academic Search Ultimate
Description
ISSN:21016275
DOI:10.1051/epjconf/202532312003