APA (7th ed.) Citation

Seck, D., Allal, D., Marlec, F., Lenoir, C., Sebbache, M., & Haddadi, K. (2025). Nanoscale Calibration Standards for On-Wafer S-Parameters measurements up to 110 GHz. EPJ Web of Conferences, 323, 1. https://doi.org/10.1051/epjconf/202532312003

Chicago Style (17th ed.) Citation

Seck, Daouda, Djamel Allal, Florent Marlec, Clément Lenoir, Mohamed Sebbache, and Kamel Haddadi. "Nanoscale Calibration Standards for On-Wafer S-Parameters Measurements Up to 110 GHz." EPJ Web of Conferences 323 (2025): 1. https://doi.org/10.1051/epjconf/202532312003.

MLA (9th ed.) Citation

Seck, Daouda, et al. "Nanoscale Calibration Standards for On-Wafer S-Parameters Measurements Up to 110 GHz." EPJ Web of Conferences, vol. 323, 2025, p. 1, https://doi.org/10.1051/epjconf/202532312003.