Investigation of dual memory behavior in RRAM: coexistence of resistive and capacitive switching phenomena.
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| Title: | Investigation of dual memory behavior in RRAM: coexistence of resistive and capacitive switching phenomena. |
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| Authors: | Kim, Hyoseob1 (AUTHOR), Kim, Suhan1 (AUTHOR), Cho, Jae-Yeong2 (AUTHOR), Lee, Sin-Hyung2 (AUTHOR) sinhlee@uos.ac.kr, Kim, Min-Hwi1,3 (AUTHOR) minhwi@cau.ac.kr |
| Source: | Scientific Reports. 4/19/2025, Vol. 15 Issue 1, p1-12. 12p. |
| Database: | Academic Search Ultimate |
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| ISSN: | 20452322 |
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| DOI: | 10.1038/s41598-025-96782-1 |
