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Structural characterization of non-continuous nanometric Pt films by angle resolved X-ray photoelectron spectroscopy.

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Bibliographic Details
Title: Structural characterization of non-continuous nanometric Pt films by angle resolved X-ray photoelectron spectroscopy.
Authors: Trombini, H.1 (AUTHOR) henrique.trombini@ufcspa.edu.br, Selau, F. F.2 (AUTHOR), Basso, C. W.2 (AUTHOR), Konrad, B.2 (AUTHOR), Grande, P. L.2 (AUTHOR), Baptista, D. L.2 (AUTHOR), Vos, M.3 (AUTHOR), Morais, J.2 (AUTHOR)
Source: Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena. Jan/Feb2025, Vol. 180 Issue 1/2, p190-208. 19p.
Database: Academic Search Ultimate
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Description
ISSN:10420150
DOI:10.1080/10420150.2025.2475369