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Multi-scale simulation of displacement damage of spatially-correlated recoiled atoms in silicon.

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Bibliographic Details
Title: Multi-scale simulation of displacement damage of spatially-correlated recoiled atoms in silicon.
Authors: Liu, Fang1 (AUTHOR), Wang, Tao1 (AUTHOR), He, Huan1 (AUTHOR), Bai, Yurong1 (AUTHOR), Shi, Tan1 (AUTHOR), Zhou, Pingan1 (AUTHOR), Chen, Chuanhao1 (AUTHOR), He, Chaohui1 (AUTHOR), Zang, Hang1 (AUTHOR) zanghang@xjtu.edu.cn
Source: Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena. Jul/Aug2025, Vol. 180 Issue 7/8, p1157-1170. 14p.
Database: Academic Search Ultimate
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Description
ISSN:10420150
DOI:10.1080/10420150.2025.2458314