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Near-Optimal Multirun March Memory Test Algorithms for Neighborhood Pattern-Sensitive Faults in Random-Access Memories.

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Bibliographic Details
Title: Near-Optimal Multirun March Memory Test Algorithms for Neighborhood Pattern-Sensitive Faults in Random-Access Memories.
Authors: Cașcaval, Petru1 (AUTHOR) petru.cascaval@academic.tuiasi.ro, Cașcaval, Doina2 (AUTHOR)
Source: Mathematics (2227-7390). Aug2025, Vol. 13 Issue 16, p2594. 30p.
Database: Academic Search Ultimate
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ISSN:22277390
DOI:10.3390/math13162594