Cașcaval, P., & Cașcaval, D. (2025). Near-Optimal Multirun March Memory Test Algorithms for Neighborhood Pattern-Sensitive Faults in Random-Access Memories. Mathematics (2227-7390), 13(16), 2594. https://doi.org/10.3390/math13162594
Chicago Style (17th ed.) CitationCașcaval, Petru, and Doina Cașcaval. "Near-Optimal Multirun March Memory Test Algorithms for Neighborhood Pattern-Sensitive Faults in Random-Access Memories." Mathematics (2227-7390) 13, no. 16 (2025): 2594. https://doi.org/10.3390/math13162594.
MLA (9th ed.) CitationCașcaval, Petru, and Doina Cașcaval. "Near-Optimal Multirun March Memory Test Algorithms for Neighborhood Pattern-Sensitive Faults in Random-Access Memories." Mathematics (2227-7390), vol. 13, no. 16, 2025, p. 2594, https://doi.org/10.3390/math13162594.