Invited - High-resolution, Data-driven 3D X-ray Imaging of Microchips using Ptychography.

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Bibliographic Details
Title: Invited - High-resolution, Data-driven 3D X-ray Imaging of Microchips using Ptychography.
Authors: Aidukas, Tomas1 (AUTHOR) tomas.aidukas@psi.ch, Phillips, Nicholas W.1,2 (AUTHOR), Diaz, Ana1 (AUTHOR), Poghosyan, Emiliya3 (AUTHOR), Müller, Elisabeth3 (AUTHOR), Levi, A.F.J.4 (AUTHOR), Aeppli, Gabriel1,5,6,7 (AUTHOR), Guizar-Sicairos, Manuel1,7 (AUTHOR), Holler, Mirko1 (AUTHOR)
Source: EPJ Web of Conferences. 9/22/2025, Vol. 335, p1-2. 2p.
Database: Academic Search Ultimate
Description
ISSN:21016275
DOI:10.1051/epjconf/202533501001