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Invited - High-resolution, Data-driven 3D X-ray Imaging of Microchips using Ptychography.

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Title: Invited - High-resolution, Data-driven 3D X-ray Imaging of Microchips using Ptychography.
Authors: Aidukas, Tomas1 (AUTHOR) tomas.aidukas@psi.ch, Phillips, Nicholas W.1,2 (AUTHOR), Diaz, Ana1 (AUTHOR), Poghosyan, Emiliya3 (AUTHOR), Müller, Elisabeth3 (AUTHOR), Levi, A.F.J.4 (AUTHOR), Aeppli, Gabriel1,5,6,7 (AUTHOR), Guizar-Sicairos, Manuel1,7 (AUTHOR), Holler, Mirko1 (AUTHOR)
Source: EPJ Web of Conferences. 9/22/2025, Vol. 335, p1-2. 2p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 188287272
AccessLevel: 2
PubType: Conference
PubTypeId: conference
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  Data: Invited - High-resolution, Data-driven 3D X-ray Imaging of Microchips using Ptychography.
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  Data: <searchLink fieldCode="JN" term="%22EPJ+Web+of+Conferences%22">EPJ Web of Conferences</searchLink>. 9/22/2025, Vol. 335, p1-2. 2p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=188287272
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        Value: 10.1051/epjconf/202533501001
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              Text: 9/22/2025
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              Y: 2025
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