Interface identification in micro-LED repair applications via depth profiling using femtosecond laser-induced breakdown spectroscopy.
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| Title: | Interface identification in micro-LED repair applications via depth profiling using femtosecond laser-induced breakdown spectroscopy. |
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| Authors: | Jung, Woonkyeong1,2 (AUTHOR), Choi, Janghee1 (AUTHOR), Jeon, Gookseon1,3 (AUTHOR), Kim, NaYoon1,4 (AUTHOR), An, Jeongcheol5 (AUTHOR), Jang, Inseok5 (AUTHOR), Jeong, Sungho5 (AUTHOR), Kim, Young-Joo2 (AUTHOR) yjkim40@yonsei.ac.kr, Keum, Hohyun1,6 (AUTHOR) hkeum@kitech.re.kr |
| Source: | Scientific Reports. 11/19/2025, Vol. 15 Issue 1, p1-9. 9p. |
| Database: | Academic Search Ultimate |
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| ISSN: | 20452322 |
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| DOI: | 10.1038/s41598-025-24765-3 |