Interface identification in micro-LED repair applications via depth profiling using femtosecond laser-induced breakdown spectroscopy.
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| Title: | Interface identification in micro-LED repair applications via depth profiling using femtosecond laser-induced breakdown spectroscopy. |
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| Authors: | Jung, Woonkyeong1,2 (AUTHOR), Choi, Janghee1 (AUTHOR), Jeon, Gookseon1,3 (AUTHOR), Kim, NaYoon1,4 (AUTHOR), An, Jeongcheol5 (AUTHOR), Jang, Inseok5 (AUTHOR), Jeong, Sungho5 (AUTHOR), Kim, Young-Joo2 (AUTHOR) yjkim40@yonsei.ac.kr, Keum, Hohyun1,6 (AUTHOR) hkeum@kitech.re.kr |
| Source: | Scientific Reports. 11/19/2025, Vol. 15 Issue 1, p1-9. 9p. |
| Database: | Academic Search Ultimate |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 189417094 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Interface identification in micro-LED repair applications via depth profiling using femtosecond laser-induced breakdown spectroscopy. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Jung%2C+Woonkyeong%22">Jung, Woonkyeong</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Choi%2C+Janghee%22">Choi, Janghee</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jeon%2C+Gookseon%22">Jeon, Gookseon</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kim%2C+NaYoon%22">Kim, NaYoon</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22An%2C+Jeongcheol%22">An, Jeongcheol</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jang%2C+Inseok%22">Jang, Inseok</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jeong%2C+Sungho%22">Jeong, Sungho</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kim%2C+Young-Joo%22">Kim, Young-Joo</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> yjkim40@yonsei.ac.kr</i><br /><searchLink fieldCode="AR" term="%22Keum%2C+Hohyun%22">Keum, Hohyun</searchLink><relatesTo>1,6</relatesTo> (AUTHOR)<i> hkeum@kitech.re.kr</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Scientific+Reports%22">Scientific Reports</searchLink>. 11/19/2025, Vol. 15 Issue 1, p1-9. 9p. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=189417094 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1038/s41598-025-24765-3 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 1 Titles: – TitleFull: Interface identification in micro-LED repair applications via depth profiling using femtosecond laser-induced breakdown spectroscopy. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Jung, Woonkyeong – PersonEntity: Name: NameFull: Choi, Janghee – PersonEntity: Name: NameFull: Jeon, Gookseon – PersonEntity: Name: NameFull: Kim, NaYoon – PersonEntity: Name: NameFull: An, Jeongcheol – PersonEntity: Name: NameFull: Jang, Inseok – PersonEntity: Name: NameFull: Jeong, Sungho – PersonEntity: Name: NameFull: Kim, Young-Joo – PersonEntity: Name: NameFull: Keum, Hohyun IsPartOfRelationships: – BibEntity: Dates: – D: 19 M: 11 Text: 11/19/2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 20452322 Numbering: – Type: volume Value: 15 – Type: issue Value: 1 Titles: – TitleFull: Scientific Reports Type: main |
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