He, J., Ludacka, U., Hunnestad, K. A., Småbråten, D. R., Shapovalov, K., Vullum, P. E., . . . Meier, D. (2025). Local p‐ and n‐Type Doping of an Oxide Semiconductor via Electric‐Field‐Driven Defect Migration. Advanced Science, 12(43), 1. https://doi.org/10.1002/advs.202506629
Chicago Style (17th ed.) CitationHe, Jiali, et al. "Local P‐ and N‐Type Doping of an Oxide Semiconductor via Electric‐Field‐Driven Defect Migration." Advanced Science 12, no. 43 (2025): 1. https://doi.org/10.1002/advs.202506629.
MLA (9th ed.) CitationHe, Jiali, et al. "Local P‐ and N‐Type Doping of an Oxide Semiconductor via Electric‐Field‐Driven Defect Migration." Advanced Science, vol. 12, no. 43, 2025, p. 1, https://doi.org/10.1002/advs.202506629.
Warning: These citations may not always be 100% accurate.