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Autonomous AI‐Driven Measurement and Characterization of 2D Materials Using Scanning Probe Microscopy.

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Bibliographic Details
Title: Autonomous AI‐Driven Measurement and Characterization of 2D Materials Using Scanning Probe Microscopy.
Authors: Sung, Jaeuk1,2 (AUTHOR), Heo, Seungjae1 (AUTHOR), Kim, Dohyun3 (AUTHOR), Kwon, Youngmee2 (AUTHOR), You, Jinyoung1 (AUTHOR), Joo, Yanggeun3 (AUTHOR), Hwang, Eunji3 (AUTHOR), Lee, Jungyu4 (AUTHOR), Cho, Sang‐Joon4 (AUTHOR), Yang, Heejun3 (AUTHOR), Kim, Yunseok1 (AUTHOR) yunseokkim@skku.edu
Source: Small Structures. Dec2025, Vol. 6 Issue 12, p1-8. 8p.
Database: Academic Search Ultimate
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ISSN:26884062
DOI:10.1002/sstr.202500379