DeepBessel: deep learning-based full-field vibration profilometry using single-shot time-averaged interference microscopy.
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| Title: | DeepBessel: deep learning-based full-field vibration profilometry using single-shot time-averaged interference microscopy. |
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| Authors: | Cywińska, Maria1 (AUTHOR) maria.cywinska@pw.edu.pl, Forjasz, Wiktor1 (AUTHOR), Wdowiak, Emilia1 (AUTHOR), Józwik, Michał1 (AUTHOR), Styk, Adam1 (AUTHOR), Patorski, Krzysztof1 (AUTHOR), Trusiak, Maciej1 (AUTHOR) |
| Source: | Optics & Lasers in Engineering. Apr2026, Vol. 199, pN.PAG-N.PAG. 1p. |
| Database: | Academic Search Ultimate |
| ISSN: | 01438166 |
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| DOI: | 10.1016/j.optlaseng.2025.109588 |
