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Noise-elimination technique to reveal a point defect in a silicon single crystal using high-resolution transmission electron microscopy.

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Bibliographic Details
Title: Noise-elimination technique to reveal a point defect in a silicon single crystal using high-resolution transmission electron microscopy.
Authors: Awaji, M.1 (AUTHOR) awajimitsuhiro@gmail.com
Source: Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena. Nov/Dec2025, Vol. 180 Issue 11/12, p1788-1794. 7p.
Database: Academic Search Ultimate
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Description
ISSN:10420150
DOI:10.1080/10420150.2025.2484738