View in EDS HTML Full Text PDF Full Text

Noise-elimination technique to reveal a point defect in a silicon single crystal using high-resolution transmission electron microscopy.

Saved in:
Bibliographic Details
Title: Noise-elimination technique to reveal a point defect in a silicon single crystal using high-resolution transmission electron microscopy.
Authors: Awaji, M.1 (AUTHOR) awajimitsuhiro@gmail.com
Source: Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena. Nov/Dec2025, Vol. 180 Issue 11/12, p1788-1794. 7p.
Database: Academic Search Ultimate
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: asn
DbLabel: Academic Search Ultimate
An: 192006951
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Noise-elimination technique to reveal a point defect in a silicon single crystal using high-resolution transmission electron microscopy.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Awaji%2C+M%2E%22">Awaji, M.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> awajimitsuhiro@gmail.com</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Radiation+Effects+%26+Defects+in+Solids%3A+Incorporating+Plasma+Techniques+%26+Plasma+Phenomena%22">Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena</searchLink>. Nov/Dec2025, Vol. 180 Issue 11/12, p1788-1794. 7p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=192006951
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1080/10420150.2025.2484738
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 1788
    Titles:
      – TitleFull: Noise-elimination technique to reveal a point defect in a silicon single crystal using high-resolution transmission electron microscopy.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Awaji, M.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 11
              Text: Nov/Dec2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 10420150
          Numbering:
            – Type: volume
              Value: 180
            – Type: issue
              Value: 11/12
          Titles:
            – TitleFull: Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena
              Type: main
ResultId 1