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Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability.

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Bibliographic Details
Title: Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability.
Authors: Kchaou, Afef1,2 (AUTHOR) kchaouafef@gmail.com, Saad, Sehmi2,3 (AUTHOR), Garrab, Hatem3,4,5 (AUTHOR)
Source: Information. Mar2026, Vol. 17 Issue 3, p249. 25p.
Database: Academic Search Ultimate
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ISSN:20782489
DOI:10.3390/info17030249