APA (7th ed.) Citation

Kchaou, A., Saad, S., & Garrab, H. (2026). Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability. Information, 17(3), 249. https://doi.org/10.3390/info17030249

Chicago Style (17th ed.) Citation

Kchaou, Afef, Sehmi Saad, and Hatem Garrab. "Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability." Information 17, no. 3 (2026): 249. https://doi.org/10.3390/info17030249.

MLA (9th ed.) Citation

Kchaou, Afef, et al. "Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability." Information, vol. 17, no. 3, 2026, p. 249, https://doi.org/10.3390/info17030249.