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Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability.

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Title: Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability.
Authors: Kchaou, Afef1,2 (AUTHOR) kchaouafef@gmail.com, Saad, Sehmi2,3 (AUTHOR), Garrab, Hatem3,4,5 (AUTHOR)
Source: Information. Mar2026, Vol. 17 Issue 3, p249. 25p.
Database: Academic Search Ultimate
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  Data: Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability.
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  Data: <searchLink fieldCode="JN" term="%22Information%22">Information</searchLink>. Mar2026, Vol. 17 Issue 3, p249. 25p.
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        Value: 10.3390/info17030249
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        Text: English
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      – TitleFull: Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability.
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              Text: Mar2026
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